Interferometric Tomography - a New Tool for Metrology on Conformal Optics

被引:0
|
作者
Gutin, Mikhail [1 ]
Gutin, Olga [1 ]
Wang, Xu-Ming [1 ]
Ehlinger, Dennis [1 ]
机构
[1] Appl Sci Innovat Inc, Troy, NY 12180 USA
关键词
Conformal optics; optical metrology; optical fabrication;
D O I
10.1117/12.887023
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Fabrication and measurement of conformal aerodynamic windows and domes to precise optical tolerances from ceramic materials remains a problem. This paper describes the development of the Interferometric Tomography inspection system, based on a new method for wavefront and surface metrology on optics with very high aberrations. The metrology system is a modular attachment for integrating a standard commercial interferometer with an existing optical fabrication tool. The system will enable high precision measurement of infrared windows and domes in the process of their fabrication, until finished to specification. The capability for fabrication and metrology of aggressively aspheric optics, "aberrated by design", will enable new optical designs of higher performance and lower cost, compared to existing optics.
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页数:11
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