In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

被引：80

作者：

Masuda, Takuya ^{[1
,2
]}

Yoshikawa, Hideki ^{[3
]}

Noguchi, Hidenori ^{[1
,2
,4
,5
]}

Kawasaki, Tadahiro ^{[6
]}

Kobata, Masaaki ^{[3
]}

Kobayashi, Keisuke ^{[3
]}

Uosaki, Kohei ^{[1
,4
,5
]}

机构：

[1] Natl Inst Mat Sci NIMS, Global Res Ctr Environm & Energy Based Nanomat Sc, Tsukuba, Ibaraki 3050044, Japan

[2] Japan Sci & Technol Agcy JST, PRESTO, Kawaguchi, Saitama 3330012, Japan

[3] Natl Inst Mat Sci NIMS, Synchrotron Xray Stn SPring 8, Sayo, Hyogo 6795148, Japan

[4] Hokkaido Univ, Grad Sch Chem Sci & Engn, Sapporo, Hokkaido 0600810, Japan

[5] Natl Inst Mat Sci NIMS, Int Ctr Mat Nanoarchitecton WPI MANA, Tsukuba, Ibaraki 3050044, Japan

[6] Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 11期

关键词：

IONIC LIQUID; WATER; INTERFACE; OXIDATION; VALENCE; STATE; XPS;

D O I：

10.1063/1.4821180

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In situ electrochemical X-ray photoelectron spectroscopy (XPS) apparatus, which allows XPS at solid/liquid interfaces under potential control, was constructed utilizing a microcell with an ultra-thin Si membrane, which separates vacuum and a solution. Hard X-rays from a synchrotron source penetrate into the Si membrane surface exposed to the solution. Electrons emitted at the Si/solution interface can pass through the membrane and be analyzed by an analyzer placed in vacuum. Its operation was demonstrated for potential-induced Si oxide growth in water. Effect of potential and time on the thickness of Si and Si oxide layers was quantitatively determined at sub-nanometer resolution. (C) 2013 AIP Publishing LLC.

引用

页数：4

共 50 条

[21] In-situ x-ray photoelectron spectroscopy for electrode/ electrolyte interfaces
Masuda, Takuya
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 256
[22] Algorithm for automatic x-ray photoelectron spectroscopy data processing and x-ray photoelectron spectroscopy imaging
Tougaard, S
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2005, 23 (04): : 741 - 745
[23] X-ray photoelectron spectroscopy in the hard X-ray regime
Fadley, C. S.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2007, 156 : XXXVI - XXXVI
[24] X-RAY PHOTOELECTRON-SPECTROSCOPY OF PT/GAAS INTERFACIAL REACTIONS
IWAKURO, H
KURODA, T
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (02): : 223 - 228
[25] Real-time X-ray photoelectron spectroscopy of surface reactions
Baraldi, A
Comelli, G
Lizzit, S
Kiskinova, M
Paolucci, G
SURFACE SCIENCE REPORTS, 2003, 49 (6-8) : 169 - 224
[26] Prospects for electrochemical X-ray photoelectron spectroscopy as a powerful electrochemical interface characterization technique
Louisia, Sheena
Koper, Marc T.M.
Mom, Rik V.
Current Opinion in Electrochemistry, 2024, 45
[27] Methionine by X-ray Photoelectron Spectroscopy
Naval Surface Warfare Center, Carderock Division, West Bethesda
MD
20817-5700, United States
Surf. Sci. Spectra, 1 (96-101):
[28] X-RAY PHOTOELECTRON-SPECTROSCOPY
WATTS, JF
VACUUM, 1994, 45 (6-7) : 653 - 671
[29] Introduction to x-ray photoelectron spectroscopy
Stevie, Fred A.
Donley, Carrie L.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (06):
[30] X-ray photoelectron spectroscopy of conodonts
Leel, GSH
Mar, GL
Rose, HR
Marshall, CP
Young, BR
Skilbeck, CG
Wilson, MA
ORGANIC GEOCHEMISTRY, 1998, 28 (11) : 759 - 765

← 1 2 3 4 5 →