Michelson interferometer with two read-out phases for the double-face strain measurement

被引：0
|
作者：
Kloos, G
机构：
来源：
TECHNISCHES MESSEN | 1997年 / 64卷 / 7-8期
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暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A modulation interferometer for the measurement of small strains is proposed that allows for the double-face detection of the vibrations of a specimen. While earlier approaches were based on polarisation-optical schemes or a repetition of the set-lip, the sequential measurement principle proposed can be realized without polarisation-optical components or doubling. But this is partially conterbalanced by the we of additional electromechanical positioning elements.
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页码：281 / 285
页数：5
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