X-Ray Reflectometry of DMPS Monolayers on a Water Substrate

被引:11
|
作者
Tikhonov, A. M. [1 ]
Asadchikov, V. E. [2 ]
Volkov, Yu. O. [2 ]
Roshchin, B. S. [2 ]
Ermakov, Yu. A. [3 ]
机构
[1] Russian Acad Sci, Kapitza Inst Phys Problems, Ul Kosygina 2, Moscow 119334, Russia
[2] Russian Acad Sci, Shubnikov Inst Crystallog, Crystallog & Photon Fed Res Ctr, Leninskii Pr 59, Moscow 119333, Russia
[3] Russian Acad Sci, Frumkin Inst Phys Chem & Electrochem, Leninskii Pr 31, Moscow 119071, Russia
基金
俄罗斯基础研究基金会;
关键词
ELECTRIC DOUBLE-LAYER; PHOSPHOLIPID MEMBRANE; HYDROSOL SUBSTRATE; VAPOR INTERFACE; SURFACE; SCATTERING; SILICA; REFLECTIVITY; IONS; TRANSITIONS;
D O I
10.1134/S1063776117120093
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The molecular structure of dimyristoyl phosphatidylserine (DMPS) monolayers on a water substrate in different phase states has been investigated by X-ray reflectometry with a photon energy of similar to 8 keV. According to the experimental data, the transition from a two-dimensional expanded liquid state to a solid gel state (liquid crystal) accompanied by the ordering of the hydrocarbon tails C14H27 of the DMPS molecule occurs in the monolayer as the surface pressure rises. The monolayer thickness is 20 +/- 3 and 28 +/- 2 in the liquid and solid phases, respectively, with the deflection angle of the molecular tail axis from the normal to the surface in the gel phase being 26A degrees +/- 8A degrees. At least a twofold decrease in the degree of hydration of the polar lipid groups also occurs under two-dimensional monolayer compression. The reflectometry data have been analyzed using two approaches: under the assumption about the presence of two layers with different electron densities in the monolayer and without any assumptions about the transverse surface structure. Both approaches demonstrate satisfactory agreement between themselves in describing the experimental results.
引用
收藏
页码:1051 / 1057
页数:7
相关论文
共 50 条
  • [31] Relative x-ray reflectometry of discrete layered structures
    Tur'yanskii, A. G.
    Aprelov, S. A.
    Gerasimenko, N. N.
    Pirshin, I. V.
    Senkov, V. M.
    TECHNICAL PHYSICS LETTERS, 2007, 33 (03) : 224 - 227
  • [32] Review on grazing incidence x-ray spectrometry and reflectometry
    Stoev, KN
    Sakurai, K
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1999, 54 (01) : 41 - 82
  • [33] Physical analysis of the inverse problem of X-ray reflectometry
    Kozhevnikov, IV
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 508 (03): : 519 - 541
  • [35] Relative x-ray reflectometry of discrete layered structures
    A. G. Tur’yanskiĭ
    S. A. Aprelov
    N. N. Gerasimenko
    I. V. Pirshin
    V. M. Senkov
    Technical Physics Letters, 2007, 33 : 224 - 227
  • [36] Observation of a superstructure X-ray peak within lipopolymer monolayers on the water surface
    Ahrens, H
    Graf, K
    Helm, CA
    LANGMUIR, 2001, 17 (11) : 3113 - 3115
  • [37] Langmuir monolayers on water surface investigated by X-ray total reflection fluorescence
    Zheludeva, SI
    Novikova, NN
    Konovalov, OV
    Kovalchuk, MV
    Stepina, ND
    Tereschenko, EY
    MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 2003, 23 (05): : 567 - 570
  • [38] Total reflection X-ray fluorescence study of Langmuir monolayers on water surface
    Novikova, NN
    Zheludeva, SI
    Konovalov, OV
    Kovalchuk, MV
    Stepina, ND
    Myagkov, IV
    Godovsky, YK
    Makarova, NN
    Tereschenko, EY
    Yanusova, LG
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2003, 36 : 727 - 731
  • [39] X-RAY AND NEUTRON REFLECTOMETRY FOR THE INVESTIGATION OF POLYMER DIFFUSION
    REITER, G
    HUTTENBACH, S
    FOSTER, M
    STAMM, M
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 341 (3-4): : 284 - 288
  • [40] Thin film characterization by means of X-ray reflectometry
    Dietsch, Reiner
    Holz, Thomas
    VAKUUM IN FORSCHUNG UND PRAXIS, 2006, 18 (05) : 22 - 25