Review on grazing incidence x-ray spectrometry and reflectometry

被引：126
|
作者：
Stoev, KN [1 ]
Sakurai, K [1 ]
机构：
[1] Natl Res Inst Met, Tsukuba, Ibaraki 305, Japan
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1999年 / 54卷 / 01期
关键词：
total reflection; specular reflection; diffuse scattering; total-reflection X-ray fluorescence; TXRF; surface sensitive analysis; surface and interface; thin film analysis; trace analysis;
D O I：
10.1016/S0584-8547(98)00160-8
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Grazing incidence X-ray techniques are now widely used for surface and thin film analysis. The present article overviews the recent advancement since 1993 of the grazing incidence X-ray spectrometry and reflectometry in both theoretical and experimental aspects. Every current topic related to the total reflection X-ray fluorescence spectrometry (TXRF) is described in detail through the introduction of numerous published works on the application in the various fields of the science and industrial technologies. Recent rapid growth in diffuse scattering at grazing incidence as well as in specular reflection is another important scope. The combined measurements of different grazing incidence X-ray techniques might be a future trend for realizing further advanced analysis of the surface and interfaces of materials. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：41 / 82
页数：42
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