Phase sensitivity of Raman spectroscopy analysis of CVD titania thin films

被引：19

作者：

Lu, Song Wei ^{[1
]}

Harris, Caroline ^{[1
]}

Walck, Scott ^{[1
]}

Arbab, Mehran ^{[1
]}

机构：

[1] PPG Ind Inc, Glass Technol Ctr, Cheswick, PA 15024 USA

来源：

JOURNAL OF MATERIALS SCIENCE | 2009年 / 44卷 / 02期

关键词：

NANOPARTICLES;

D O I：

10.1007/s10853-008-3086-z

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photocatalytic titania thin films deposited on float glass by chemical vapor deposition were analyzed by transmission electron microscopy, atomic force microscopy, Raman spectroscopy, and X-ray diffraction. Raman spectroscopy results indicate its phase sensitivity in the presence of trace amount of anatase. This suggests a preferable method of using Raman spectroscopy to characterize mixed phases of titania thin films, especially when titania coatings are deposited on other crystalline oxide materials, for example, tin oxide.

引用

页码：541 / 544

页数：4

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