Unstable van der Waals driven line rupture in Marangoni driven thin viscous films

被引:46
|
作者
Warner, MRE
Craster, RV
Matar, OK
机构
[1] Univ London Imperial Coll Sci Technol & Med, Dept Math, London SW7 2BZ, England
[2] Univ London Imperial Coll Sci Technol & Med, Dept Chem Engn & Chem Technol, London SW7 2BY, England
关键词
D O I
10.1063/1.1460878
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
An intriguing, dramatic and, at present, not fully understood instability often accompanies surfactant driven flows on thin films. This paper investigates a candidate mechanism that could create and drive this instability, van der Waals rupture, via numerical simulations coupled with analytical techniques. The spreading process itself is modelled with a pair of coupled evolution equations for the fluid film thickness and surfactant concentration that are derived in the lubrication approximation. These equations are then linearized about a base state that corresponds to the one-dimensional rupturing solution, and equations for the evolution of the transverse disturbances are derived. These linearized equations are investigated in several ways: numerical simulations where the perturbations are driven by the time evolving base state, or where the base state is frozen at a time t(f) close to the rupture event. The quasistatic initial value problem is also investigated as an eigenvalue problem, where the eigenvalue represents the quasistatic growth rate. We also take advantage of recent similarity scalings and results deduced for rupture, in the absence of surfactant, to motivate some of our numerical investigations. Additionally, we investigate the fully nonlinear equations including the transverse components. Perhaps interestingly, three-dimensional reconstructions of the film profile using the most dangerous mode from linear theory, as well as profiles from direct numerical simulations of the full nonlinear governing equations, that is, including interactions in the transverse direction, assume the form of finger-like patterns. (C) 2002 American Institute of Physics.
引用
收藏
页码:1642 / 1654
页数:13
相关论文
共 50 条
  • [21] Ionic mobility driven by correlated van der Waals and electrostatic forces
    Samanta, Tuhin
    Matyushov, Dmitry V.
    [J]. JOURNAL OF CHEMICAL PHYSICS, 2022, 156 (20):
  • [22] Intrinsic flexoelectricity of van der Waals epitaxial thin films
    Shu, Longlong
    Wang, Zhiguo
    Liang, Renhong
    Zhang, Zhen
    Shu, Shengwen
    Tang, Changxin
    Li, Fei
    Zheng, Ren-Kui
    Ke, Shanming
    Catalan, Gustau
    [J]. PHYSICAL REVIEW B, 2022, 106 (02)
  • [23] Finite Morse index steady states of van der Waals force driven thin film equations
    Guo, Zongming
    Ma, Li
    [J]. JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS, 2010, 368 (02) : 559 - 572
  • [24] Buckle-driven delamination of thin film and the influence of the Casimir or van der Waals force interaction
    Yu, SW
    Li, QY
    [J]. PROCEEDINGS OF THE SIXTH IEEE CPMT CONFERENCE ON HIGH DENSITY MICROSYSTEM DESIGN AND PACKAGING AND COMPONENT FAILURE ANALYSIS (HDP'04), 2004, : 128 - 133
  • [25] Spin-Chirality-Driven Multiferroicity in van der Waals Monolayers
    Liu, Chao
    Ren, Wei
    Picozzi, Silvia
    [J]. PHYSICAL REVIEW LETTERS, 2024, 132 (08)
  • [26] Similarity solutions for van der Waals rupture of a thin film on a solid substrate
    Zhang, WW
    Lister, JR
    [J]. PHYSICS OF FLUIDS, 1999, 11 (09) : 2454 - 2462
  • [27] Stabilization of Thin Liquid Films by Repulsive van der Waals Force
    Li, Er Qiang
    Vakarelski, Ivan U.
    Chan, Derek Y. C.
    Thoroddsen, Sigurdur T.
    [J]. LANGMUIR, 2014, 30 (18) : 5162 - 5169
  • [28] Steady-profile fingering flows in Marangoni driven thin films
    Sur, J
    Witelski, TP
    Behringer, RP
    [J]. PHYSICAL REVIEW LETTERS, 2004, 93 (24)
  • [29] Van der Waals energy of an atom in the proximity of thin metal films
    Dept. of Phys. and Msrmt. Technology, Linköping University, S-581 83 Linköping, Sweden
    [J]. Physical Review A - Atomic, Molecular, and Optical Physics, 2000, 61 (05): : 527031 - 527036
  • [30] Fractional van der Waals interaction between thin metallic films
    Boström, M
    Sernelius, BE
    [J]. PHYSICAL REVIEW B, 2000, 61 (03): : 2204 - 2210