Similarity solutions for van der Waals rupture of a thin film on a solid substrate

被引:150
|
作者
Zhang, WW [1 ]
Lister, JR
机构
[1] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA
[2] Univ Cambridge, Dept Appl Math & Theoret Phys, Inst Theoret Geophys, Cambridge CB3 9EW, England
关键词
D O I
10.1063/1.870110
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
Rupture of a thin viscous film on a solid substrate under a balance of destabilizing van der Waals pressure and stabilizing capillary pressure is shown to possess a countably infinite number of similarity solutions in each of which the horizontal lengthscale decreases like (t(R)-t)(2/5) and the film thickness decreases like (t(R)-t)(1/5), where t(R)-t is the time remaining before rupture. Only the self-similar solution corresponding to the least oscillatory curvature profile is observed in time-dependent numerical simulations of the governing partial differential equation. The numerical strategy employed to obtain the self-similar solutions is developed from far-field asymptotic analysis of the similarity equations. (C) 1999 American Institute of Physics. [S1070-6631(99)03509-6].
引用
收藏
页码:2454 / 2462
页数:9
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