MCM test vectors from logic simulation

被引：0
|
作者：
Flint, A [1 ]
机构：
[1] MOTOROLA INC,AUSTIN,TX 78721
来源：
1966 INTERNATIONAL CONFERENCE ON MULTICHIP MODULES, PROCEEDINGS | 1996年 / 2794卷
关键词：
MCM test; logic simulation; tester compatibility;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：205 / 209
页数：5
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