MCM test vectors from logic simulation

被引：0

作者：

Flint, A ^{[1
]}

机构：

[1] MOTOROLA INC,AUSTIN,TX 78721

来源：

1966 INTERNATIONAL CONFERENCE ON MULTICHIP MODULES, PROCEEDINGS | 1996年 / 2794卷

关键词：

MCM test; logic simulation; tester compatibility;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：205 / 209

页数：5

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