USE SIMULATION VECTORS TO GENERATE TEST VECTORS

被引：0
|
作者：
FRANZ, M [1 ]
机构：
[1] APPL MICRO CIRCUITS CORP,ADV DEV,SAN DIEGO,CA
来源：
EDN | 1985年 / 30卷 / 15期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：233 / 238
页数：6
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