Soft-Error Tolerant TCAMs for High-Reliability Packet Classifications

被引:0
|
作者
Syafalni, Infall [1 ]
Sasao, Tsutomu [2 ]
Wen, Xiaoqing [1 ]
Holst, Stefan [1 ]
Miyase, Kohei [1 ]
机构
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka, Japan
[2] Meiji Univ, Tokyo 101, Japan
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
In the internet, packets are classified by source and destination addresses, ports, and protocol type. Ternary content addressable memories (TCAMs) are often used to perform this operation. However, high-reliability packet classifiers in aerospace network applications require soft-error tolerant TCAMs to prevent system from errors caused by environmental factors such as high-energy radiations. This paper shows a soft-error tolerant TCAM (STTCAM), which enhances the reliability of TCAMs for soft-errors. The STTCAM randomly selects a search key to be evaluated. Then, parallel TCAMs detect single-bit flip errors. When the search key matches the last word, the STTCAM calculates the similarity of the search key to the TCAM word. If 99% of similarity is detected, then a suspected error is found and the STTCAM refreshes the TCAM words by using a backup ECC-SRAM. Experimental results show that the STTCAM improves TCAMs reliability significantly than the existing scheme. The STTCAM can be easily implemented and is useful for fault-tolerant packet classifiers.
引用
收藏
页码:471 / 474
页数:4
相关论文
共 50 条
  • [41] PAIS: Parallelization Aware Instruction Scheduling for Improving Soft-error Reliability of GPU-based Systems
    Lee, Haeseung
    Chen, Hsinchung
    Al Faruque, Mohammad Abdullah
    PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 1568 - 1573
  • [42] SOFT-ERROR IMMUNITY EVALUATION OF DRAM USING HIGH-ENERGY NUCLEAR MICROPROBE
    SAYAMA, H
    HARA, S
    ANDOH, H
    KIMURA, H
    OHNO, Y
    SATOH, S
    TAKAI, M
    MICROELECTRONIC ENGINEERING, 1993, 21 (1-4) : 213 - 216
  • [43] SOFT-DEFECT DETECTION (SDD) TECHNIQUE FOR A HIGH-RELIABILITY CMOS SRAM
    KUO, C
    TOMS, T
    NEEL, BT
    JELEMENSKY, J
    CARTER, EA
    SMITH, P
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (01) : 61 - 67
  • [44] Soft-Error-Tolerant Design Methodology for Balancing Performance, Power, and Reliability
    Chou, Hsuan-Ming
    Hsiao, Ming-Yi
    Chen, Yi-Chiao
    Yang, Keng-Hao
    Tsao, Jean
    Lung, Chiao-Ling
    Chang, Shih-Chieh
    Jone, Wen-Ben
    Chen, Tien-Fu
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 23 (09) : 1628 - 1639
  • [45] Soft-error tolerant transistor/magnetic-tunnel-junction hybrid non-volatile C-element
    Onizawail, Naoya
    Hanyu, Takahiro
    IEICE ELECTRONICS EXPRESS, 2014, 11 (24):
  • [46] SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications
    Merlin, Itay
    Zambrano, Benjamin
    Lanuzza, Marco
    Fish, Alexander
    Haran, Avner
    Yavits, Leonid
    IEEE ACCESS, 2025, 13 : 12032 - 12043
  • [47] Managing Multi-Core Soft-Error Reliability Through Utility-driven Cross Domain optimization
    Zhang, Wangyuan
    Li, Tao
    2008 INTERNATIONAL CONFERENCE ON APPLICATION-SPECIFIC SYSTEMS, ARCHITECTURES AND PROCESSORS, 2008, : 132 - 137
  • [48] Reliability Assessment and Quantitative Evaluation of Soft-Error Resilient 3D Network-on-Chip Systems
    Dang, Khanh N.
    Meyer, Michael
    Okuyama, Yuichi
    Ben Abdallah, Abderazek
    2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 161 - 166
  • [49] Evaluating the Use of High-Reliability Principles to Increase Error Event Reporting A Retrospective Review
    Duffey, Pam
    Oliver, JoAnn S.
    Newcomb, Patricia
    JOURNAL OF NURSING ADMINISTRATION, 2019, 49 (06): : 310 - 314
  • [50] Safety Does Not Happen by Accident: Preventing Human Error Through High-Reliability Practices
    Vitale, Michael G.
    Raman, Divya L.
    JOURNAL OF PEDIATRIC ORTHOPAEDICS, 2022, 42 : S35 - S38