Soft-Error Tolerant TCAMs for High-Reliability Packet Classifications

被引:0
|
作者
Syafalni, Infall [1 ]
Sasao, Tsutomu [2 ]
Wen, Xiaoqing [1 ]
Holst, Stefan [1 ]
Miyase, Kohei [1 ]
机构
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka, Japan
[2] Meiji Univ, Tokyo 101, Japan
关键词
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
In the internet, packets are classified by source and destination addresses, ports, and protocol type. Ternary content addressable memories (TCAMs) are often used to perform this operation. However, high-reliability packet classifiers in aerospace network applications require soft-error tolerant TCAMs to prevent system from errors caused by environmental factors such as high-energy radiations. This paper shows a soft-error tolerant TCAM (STTCAM), which enhances the reliability of TCAMs for soft-errors. The STTCAM randomly selects a search key to be evaluated. Then, parallel TCAMs detect single-bit flip errors. When the search key matches the last word, the STTCAM calculates the similarity of the search key to the TCAM word. If 99% of similarity is detected, then a suspected error is found and the STTCAM refreshes the TCAM words by using a backup ECC-SRAM. Experimental results show that the STTCAM improves TCAMs reliability significantly than the existing scheme. The STTCAM can be easily implemented and is useful for fault-tolerant packet classifiers.
引用
收藏
页码:471 / 474
页数:4
相关论文
共 50 条
  • [21] FAULT-TOLERANT DESIGN STRATEGIES FOR HIGH-RELIABILITY AND SAFETY
    VAIDYA, NH
    PRADHAN, DK
    IEEE TRANSACTIONS ON COMPUTERS, 1993, 42 (10) : 1195 - 1206
  • [22] DESIGN AND ANALYSIS OF HIGH-RELIABILITY AND FAULT-TOLERANT SYSTEMS
    WHETTON, C
    COMMUNICATIONS OF THE ACM, 1987, 30 (11) : 981 - 982
  • [23] SOFT-ERROR FILTERING - A SOLUTION TO THE RELIABILITY PROBLEM OF FUTURE VLSI DIGITAL CIRCUITS
    SAVARIA, Y
    RUMIN, NC
    HAYES, JF
    AGARWAL, VK
    PROCEEDINGS OF THE IEEE, 1986, 74 (05) : 669 - 683
  • [24] Architectural-level soft-error modeling for estimating reliability of computer systems
    Sugihara, Makoto
    Ishihara, Tohru
    Murakami, Kazuaki
    IEICE TRANSACTIONS ON ELECTRONICS, 2007, E90C (10): : 1983 - 1991
  • [25] Area-Efficient Soft-Error Tolerant Datapath Synthesis Based on Speculative Resource Sharing
    Oh, Junghoon
    Kaneko, Mineo
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2016, E99A (07) : 1311 - 1322
  • [26] Automated Selection of Check Variables for Area-Efficient Soft-Error Tolerant Datapath Synthesis
    Oh, Junghoon
    Kaneko, Mineo
    2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2015, : 49 - 52
  • [27] Resource Management for Improving Soft-Error and Lifetime Reliability of Real-Time MPSoCs
    Zhou, Junlong
    Sun, Jin
    Zhou, Xiumin
    Wei, Tongquan
    Chen, Mingsong
    Hu, Shiyan
    Hu, Xiaobo Sharon
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019, 38 (12) : 2215 - 2228
  • [28] A soft-error tolerant content-addres sable memory (CAM) using an error-correcting-match scheme
    Pagiamtzis, Kostas
    Azizi, Navid
    Najm, Farid N.
    PROCEEDINGS OF THE IEEE 2006 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2006, : 301 - 304
  • [29] A Novel Variation-Tolerant 4T-DRAM Cell With Enhanced Soft-Error Tolerance
    Ganapathy, Shrikanth
    Canal, Ramon
    Alexandrescu, Dan
    Costenaro, Enrico
    Gonzalez, Antonio
    Rubio, Antonio
    2012 IEEE 30TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2012, : 472 - 477
  • [30] SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
    Tseng, Tsu-Wei
    Li, Jn-Fu
    JOURNAL OF INFORMATION SCIENCE AND ENGINEERING, 2011, 27 (02) : 643 - 656