Comparison characterization of copper selenide thin layers prepared on polyamide 6 films by sorption-diffusion method

Some earlier synthesized copper selenide (Cu (x) Se) layers formed on the surface of polyamide 6 by sorption-diffusion method using potassium selenotrithionate (K2SeS2O6) as precursor of selenium were characterized by the XRD, XPS and SEM methods. According to the results of the SEM studies, the most uniform Cu (x) Se layers form at the 2.5 h polyamide seleniumized duration at the temperature of 60A degrees C. The thickness of layers, which dependeds on the duration of seleniumization, changed in the range of 0.8-3.2 A mu m. The XRD patterns of not previously studied Cu (x) Se layers showed their phase composition of six copper selenides: Cu2Se, two phases of CuSe2, Cu3Se2, berzellianite, Cu2-x Se, and bellidoite Cu2Se. Analysis of the XRD and XPS data shows that the macrostructure and composition of the CuxSe layers depend on the conditions of formation of these layers.