Analysis of Dynamic Behavior of V-Shaped Atomic Force Microscope Cantilever in Contact and Tapping Modes by Considering Various Immersion Surroundings

被引:1
|
作者
Pasha, Ali Hossein Gholizadeh [1 ]
Sadeghi, Ali [1 ]
机构
[1] Islamic Azad Univ, Damavand Branch, Renewable Energy Res Ctr, Damavand, Iran
关键词
Atomic force microscope; V-shaped beam; Various surroundings; Finite element method; Frequency response function; VIBRATION MODES; BEAM; SENSITIVITY;
D O I
10.1007/s13369-020-04660-x
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
In atomic force microscope (AFM) as a powerful device for scanning the samples, a cantilever is used to sense the variations of its dynamic characteristics due to the tip-sample interaction. Theoretical models that can accurately simulate the surface-coupled dynamics of the cantilever are necessary for quantifiable and qualitative explanation and understanding of measured results. A good understanding of the dynamics of AFM cantilevers vibrating in liquid is needed for the interpretation of scanning images, selection of AFM operating conditions and evaluation of sample's mechanical properties. In this paper, the amplitude of frequency response functions (FRF) of vertical and rotational movements for a V-shaped atomic force microscope beam immersed in various surroundings has been surveyed for the first time. For rising the precision of theoretical model, we have considered all needful details for the beam and sample. The amplitude of FRF of vertical and rotational movements and resonant frequency of beam have been surveyed by supposing cantilever thickness, breadth and length, the angle between cantilever and sample surface, tip height and normal and lateral tip-sample interaction force. In this study, carbon tetrachloride (CCL4), methanol, acetone, water and air have been considered as surroundings. The results show that an increase in the tip-sample interaction force considerably raises the amount of resonant frequency. By increasing the liquid viscosity, the amplitude of FRF for vertical and rotational movements and resonant frequency reduce. Moreover, the amplitude of FRF of vertical and rotational movements is reduced by raising the rectangular and tapered parts lengths, but increased by raising the rectangular part breadth and cantilever thickness. The resonant frequency goes down by increasing the rectangular and tapered parts lengths and rectangular part breadth, but increases by rising the cantilever thickness. In this paper, we have tried to model the realistic dynamic behavior of V-shaped AFM beam in contact and tapping modes with the most accuracy. Results show good agreement. Based on the experimental results, the present theoretical model can forestall better the realistic behavior of tapping mode than the contact mode for V-shaped AFM cantilever. Based on the complexity of the V-shaped AFM cantilever, this study has been done for the first time in both of the contact and tapping modes.
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页码:9045 / 9060
页数:16
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