共 50 条
- [2] FLEXURAL SENSITIVITY OF A V-SHAPED AFM CANTILEVER MADE OF FUNCTIONALLY GRADED MATERIALS [J]. PROCEEDINGS OF THE ASME 10TH BIENNIAL CONFERENCE ON ENGINEERING SYSTEMS DESIGN AND ANALYSIS, 2010, VOL 1, 2010, : 495 - 501
- [3] Sensitivity analysis of the nanoparticles on substrates using the atomic force microscope with rectangular and V-shaped cantilevers [J]. MICRO & NANO LETTERS, 2011, 6 (08): : 586 - 591
- [7] Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever [J]. Applied Physics A, 1998, 66 : S361 - S364
- [8] Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S361 - S364
- [10] PARALLEL BEAM APPROXIMATION FOR V-SHAPED ATOMIC-FORCE MICROSCOPE CANTILEVERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (09): : 4583 - 4587