Dose-rate effects on the bulk etch-rate of CR-39 track detector exposed to low-LET radiations

被引：25

作者：

Yamauchi, T

Taniguchi, T

Oda, K

Ikeda, T

Honda, Y

Tagawa, S

机构：

[1] Kobe Univ Mercantile Marine, Dept Nucl Engn, Higashinada Ku, Kobe, Hyogo 658, Japan

[2] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 567, Japan

来源：

RADIATION MEASUREMENTS | 1999年 / 31卷 / 1-6期

关键词：

CR-39; track detector; gamma-ray; pulsed electron; absorbed dose; dose rate; bulk etch rate; irradiation damage; oxygen;

D O I：

10.1016/S1350-4487(99)00132-8

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

The effect of gammna-rays and pulsed electrons has been investigated on the bulk etch rate of CR-39 detector at doses up to 100 kGy under various dose-rate between 0.0044 and 35.0 Gy/s. The bulk etch rate increased exponentially with the dose at every examined dose-rates. It was reveled to be strongly depend on the dose-rate: the bulk etch rate was decreased with increasing dose-rate at the same total dose. A primitive model was proposed to explain the dose-rate effect in which oxygen dissolved Was assumed to dominate the damage formation process.

引用

页码：121 / 126

页数：6

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