Dose-rate effects on the bulk etch-rate of CR-39 track detector exposed to low-LET radiations

被引：25
|
作者：
Yamauchi, T
Taniguchi, T
Oda, K
Ikeda, T
Honda, Y
Tagawa, S
机构：
[1] Kobe Univ Mercantile Marine, Dept Nucl Engn, Higashinada Ku, Kobe, Hyogo 658, Japan
[2] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 567, Japan
来源：
RADIATION MEASUREMENTS | 1999年 / 31卷 / 1-6期
关键词：
CR-39; track detector; gamma-ray; pulsed electron; absorbed dose; dose rate; bulk etch rate; irradiation damage; oxygen;
D O I：
10.1016/S1350-4487(99)00132-8
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
The effect of gammna-rays and pulsed electrons has been investigated on the bulk etch rate of CR-39 detector at doses up to 100 kGy under various dose-rate between 0.0044 and 35.0 Gy/s. The bulk etch rate increased exponentially with the dose at every examined dose-rates. It was reveled to be strongly depend on the dose-rate: the bulk etch rate was decreased with increasing dose-rate at the same total dose. A primitive model was proposed to explain the dose-rate effect in which oxygen dissolved Was assumed to dominate the damage formation process.
引用
收藏
页码：121 / 126
页数：6
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