Ultra-Thin Silicon Strip Detectors for Hadrontherapy Beam Monitoring

被引：0
|
作者：
Bouterfa, Mohamed [1 ]
Flandre, Denis [1 ]
机构：
[1] Catholic Univ Louvain, B-1348 Louvain, Belgium
来源：
2012 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID STATE CIRCUIT (EDSSC) | 2012年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：2
相关论文
共 50 条
  • [21] Characterization of ultra-thin PtSi films for infrared detectors
    Bender, H
    Roussel, P
    Kolodinski, S
    Torres, A
    Donaton, RA
    Maex, K
    vanderSluis, P
    SILICIDE THIN FILMS - FABRICATION, PROPERTIES, AND APPLICATIONS, 1996, 402 : 449 - 454
  • [22] In-beam performance of the ALICE silicon strip detectors
    Agnese, F.
    Benedosso, F.
    Bonnet, D.
    Borshchov, V. N.
    Borysov, O.
    Bosisio, L.
    Bregant, M.
    van den Brink, A.
    Camerini, P.
    Contin, G.
    Fragiacomo, E.
    Gojak, C.
    Grion, N.
    Grosso, R.
    de Haas, A. P.
    Igolkine, S. N.
    Kiprich, S. K.
    Kluit, R.
    Kuhn, C.
    Kuijer, P. G.
    Listratenko, O. M.
    Lutz, J. R.
    Margagliotti, G. V.
    Nooren, G. J. L.
    Oinonen, M.
    Oskamp, C. J.
    Peryt, W.
    Piano, S.
    Plumeri, S.
    Radiojevic, Z.
    Rachevskaia, I.
    Rui, R.
    Schippers, J. D.
    Seppanen, H.
    Sokolov, O.
    Szuba, M.
    Timmer, P.
    Zinovjev, G.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 562 (01): : 110 - 119
  • [23] Test of the CMS silicon strip detectors in the hadron beam
    Zhukov, V
    Bauer, T
    Friedl, M
    Hrubec, J
    Krammer, M
    Pernicka, M
    Creanza, D
    Radicci, V
    Dierlamm, A
    Dirkes, G
    Grigoriev, E
    Hartmann, F
    Heier, S
    Röderer, F
    Bisello, D
    Kaminsky, A
    Marseguerra, G
    Pantano, D
    Stavitski, I
    Angarano, M
    Biasini, M
    Bilei, GM
    Cecchetti, S
    Fano, L
    Giorgi, M
    Postolache, V
    Servoli, L
    ADVANCED TECHNOLOGY AND PARTICLE PHYSICS, PROCEEDINGS, 2002, 1 : 224 - 230
  • [24] Electrochemical study of ultra-thin silicon oxides
    Bertagna, V
    Erre, R
    Petitdidier, S
    Lévy, D
    Chemla, M
    CLEANING TECHNOLOGY IN SEMICONDUCTOR DEVICE MANUFACTURING VII, PROCEEDINGS, 2002, 2002 (26): : 211 - 217
  • [25] Bendable Ultra-Thin Silicon Chips on Foil
    Dahiya, Ravinder S.
    Adami, Andrea
    Collini, Cristian
    Lorenzelli, Leandro
    2012 IEEE SENSORS PROCEEDINGS, 2012, : 231 - 234
  • [26] Electrical conductivity of ultra-thin silicon nanowires
    Rochdi, Nabil
    Tonneau, Didier
    Jandard, Franck
    Dallaporta, Herve
    Safarov, Viatcheslav
    Gautier, Jacques
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2008, 26 (01): : 159 - 163
  • [27] Properties of ultra-thin thermal silicon nitride
    Buchheit, KM
    Takeuchi, H
    King, TJ
    FUNDAMENTALS OF NOVEL OXIDE/SEMICONDUCTOR INTERFACES, 2004, 786 : 117 - 122
  • [28] Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
    张燕燕
    程然
    倪东
    田明
    卢继武
    赵毅
    Chinese Physics B, 2019, 28 (07) : 503 - 507
  • [29] Automated handling of ultra-thin silicon wafers
    Schraub, FAT
    SOLID STATE TECHNOLOGY, 2002, 45 (09) : 59 - +
  • [30] Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
    Zhang, Yan-Yan
    Cheng, Ran
    Ni, Dong
    Tian, Ming
    Lu, Ji-Wu
    Zhao, Yi
    CHINESE PHYSICS B, 2019, 28 (07)
12345