Extended Regression Test Model for Test Suite Reduction

被引：0

作者：

Lawanna, Adtha ^{[1
]}

机构：

[1] Assumption Univ, Sci & Technol, Dept Informat Technol, Samuthprakarn, Thailand

来源：

2017 IEEE 6TH GLOBAL CONFERENCE ON CONSUMER ELECTRONICS (GCCE) | 2017年

关键词：

test case; test suite; reduction; deletion;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Problem of test suite size increases in the process of software maintenance when numbers of revision are required can be solved by reduction algorithms such random and regression test reduction. Nevertheless, the whole performance need to be improved. Therefore, this research paper proposes the new model that is used for improving the regression test reduction, which guarantees the best results compared with traditional methods by adding four algorithms; testing, ordering, deleting test cases and fixing bugs. Accordingly, it gives smaller size and higher percent fixing bugs as about 40% and 200% respectively.

引用

页数：5

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