A Test Suite Reduction Method based on Test Requirement Partition

被引:0
|
作者
Wan Yongbing [1 ]
Xu Zhongwei [1 ]
Yu Gang [2 ]
Zhu Yujun [1 ]
机构
[1] Tongji Univ, Sch Elect & Informat Engn, Shanghai, Peoples R China
[2] Shanghai Univ, Sydney Inst Language & Commerce, Shanghai, Peoples R China
基金
中国国家自然科学基金;
关键词
Test suite reduction; Test requirement; Test case; Fault detection capability;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Test suite reduction aims at improving the effectiveness of testing and cutting down the test cost with the least test cases under the condition of satisfying all testing objectives. This paper proposes a new method for test suite reduction with test requirement partition. First, it gives a partition to the set of all the available test cases based on the test requirements. After that, a test suite by the partition is generated and then a smaller test suite is obtained by further reduction according to the relationship between test requirements and test suites. At last, the experimental result shows that the proposed approach is helpful to generate the reduced test suite, which is used to test all the test requirements sufficiently by comparing with the existed methods, at the cost of a moderate loss in fault detection capability.
引用
收藏
页码:85 / 95
页数:11
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