Determination of the emission spectrum of an X-ray tube of a wavelength-dispersive series X-ray fluorescence spectrometer

被引：4

作者：

Oskolok, K. V. ^{[1
]}

Monogarova, O. V. ^{[1
]}

机构：

[1] Moscow MV Lomonosov State Univ, Dept Chem, Moscow 119991, Russia

来源：

JOURNAL OF ANALYTICAL CHEMISTRY | 2008年 / 63卷 / 12期

关键词：

Emission Spectrum; Crystal Analyzer; Radiation Attenuation; Aperture Ratio; Wavelength Distribution;

D O I：

10.1134/S1061934808120071

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A laboratory method is proposed for the determination of the emission spectrum of an X-ray tube of a wavelength-scattering series X-ray fluorescence spectrometer. The developed approach is based on the description of distortions by the spectrometer units and an inverse mathematical transformation of the wavelength distribution of the intensity of the primary radiation scattered by a special auxiliary sample. The developed algorithm is convenient for refining the spectrum of an X-ray tube with its physical deterioration during operation.

引用

页码：1176 / 1181

页数：6

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