Determination of the emission spectrum of an X-ray tube of a wavelength-dispersive series X-ray fluorescence spectrometer

A laboratory method is proposed for the determination of the emission spectrum of an X-ray tube of a wavelength-scattering series X-ray fluorescence spectrometer. The developed approach is based on the description of distortions by the spectrometer units and an inverse mathematical transformation of the wavelength distribution of the intensity of the primary radiation scattered by a special auxiliary sample. The developed algorithm is convenient for refining the spectrum of an X-ray tube with its physical deterioration during operation.