Surface roughness effect on copper-alumina adhesion

被引:19
|
作者
Lim, Ju Dy [1 ,2 ,3 ]
Susan, Yeow Su Yi [2 ]
Daniel, Rhee MinWoo [1 ]
Leong, Kam Chew [3 ]
Wong, Chee Cheong [2 ]
机构
[1] ASTAR, Inst Microelect, Singapore, Singapore
[2] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore
[3] GLOBALFOUNDRIES Singapore Pte Ltd, Singapore 738406, Singapore
关键词
Alumina; Copper; Bonding strength; Surface roughness; Surface area; IMPROVEMENT; PLASMA;
D O I
10.1016/j.microrel.2013.07.016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The surface roughness of the substrate itself could play an important role for the bonding at the interface. In this paper, a correlation of the surface roughness of a rigid alumina substrate and its 2D model of estimated surface area has been studied using Atomic Force Microscopy (AFM). With rougher surface, the adhesive strength between a deposited copper film and the alumina substrate is higher due to the larger contact area at the interface. For 99.99% pure copper-96% pure alumina, this effect can account for an adhesive strength increment of more than 50%. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1548 / 1552
页数:5
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