Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure

被引：26

作者：

Matsuda, Keiko ^{[1
]}

Watanabe, Takeshi ^{[1
]}

Sakaguchi, Koichi ^{[1
]}

Yoshikawa, Masanobu ^{[1
]}

Doi, Takuya ^{[2
]}

Masuda, Atsushi ^{[2
]}

机构：

[1] Toray Res Ctr Ltd, Otsu, Shiga 5208567, Japan

[2] Natl Inst Adv Ind Sci & Technol, Tosu, Saga 8410052, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2012年 / 51卷 / 10期

关键词：

TIO2; FUTURE; GLASS;

D O I：

10.1143/JJAP.51.10NF07

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We used several analytical methods to identify the mechanism underlying the performance degradation in a photovoltaic (PV) module subjected to long-term (10 years) field exposure. Cloudy visual defects in this module were caused by delamination between the poly(ethylene vinyl acetate) (EVA) and antireflection coating films on the Si substrate. The delamination was considered to be caused by the formation of a segregation layer and oxidative degradation of EVA. Furthermore, it was found that sodium ions diffused from the superstrate glass into the EVA film and Si cell. We confirm that diffusion of sodium ions caused the degradation of Si cells and the superstrate glass of this module. (C) 2012 The Japan Society of Applied Physics

引用

页数：5

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