Degradation Analysis of PV Modules After Long-Term Exposure in Florida

被引：0
|
作者：
Schneller, Eric J. [1 ]
Shinde, Onkar
Dhere, Neelkanth G.
Davis, Kristopher O.
机构：
[1] Univ Cent Florida, Orlando, FL 32816 USA
来源：
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC) | 2018年
关键词：
reliability; durability; module performance; electroluminescence;
D O I：
暂无
中图分类号：
X [环境科学、安全科学];
学科分类号：
08 ; 0830 ;
摘要：
Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.
引用
收藏
页码：0767 / 0770
页数：4
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