Measuring the thermal resistance of vertical interfaces separating two different media using lock-in infrared thermography with laser spot excitation

被引：0
|
作者：
Bedoya, A. [1 ,2 ]
Gonzalez, J. [1 ,3 ]
Mendioroz, A. [1 ]
Salazar, A. [1 ]
机构：
[1] Univ Pais Vasco UPV EHU, Escuela Ingn Bilbao, Dept Fis Aplicada 1, Plaza Ingeniero Torres Quevedo 1, Bilbao 48013, Spain
[2] CICATA, IPN, Unidad Legaria, Legaria 694, Mexico City 11500, DF, Mexico
[3] CINVESTAV Unidad Merida, Dept Appl Phys, Carretera Antigua Progreso Km6,AP 73 Cordemex, Merida 97310, Yucatan, Mexico
来源：
14TH QUANTITATIVE INFRARED THERMOGRAPHY CONFERENCE | 2018年
关键词：
D O I：
10.21611/qirt.2018.100
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We propose a method to measure the thermal contact resistance at the interface between two different media using lock-in infrared thermography with laser spot heating. We find an analytical expression for the surface temperature of the two-media when they are illuminated by a modulated Gaussian laser spot. The surface temperature on the two-media with calibrated interface thickness is measured using an infrared camera. By fitting the surface temperature to the model, the thermal resistance of the interface is obtained. A good agreement between the nominal and retrieved thickness of the interface is found confirming the validity of the model.
引用
收藏
页码：806 / 807
页数：2
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