Measuring the thermal resistance of vertical interfaces separating two different media using lock-in infrared thermography with laser spot excitation

被引：0

作者：

Bedoya, A. ^{[1
,2
]}

Gonzalez, J. ^{[1
,3
]}

Mendioroz, A. ^{[1
]}

Salazar, A. ^{[1
]}

机构：

[1] Univ Pais Vasco UPV EHU, Escuela Ingn Bilbao, Dept Fis Aplicada 1, Plaza Ingeniero Torres Quevedo 1, Bilbao 48013, Spain

[2] CICATA, IPN, Unidad Legaria, Legaria 694, Mexico City 11500, DF, Mexico

[3] CINVESTAV Unidad Merida, Dept Appl Phys, Carretera Antigua Progreso Km6,AP 73 Cordemex, Merida 97310, Yucatan, Mexico

来源：

14TH QUANTITATIVE INFRARED THERMOGRAPHY CONFERENCE | 2018年

关键词：

D O I：

10.21611/qirt.2018.100

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We propose a method to measure the thermal contact resistance at the interface between two different media using lock-in infrared thermography with laser spot heating. We find an analytical expression for the surface temperature of the two-media when they are illuminated by a modulated Gaussian laser spot. The surface temperature on the two-media with calibrated interface thickness is measured using an infrared camera. By fitting the surface temperature to the model, the thermal resistance of the interface is obtained. A good agreement between the nominal and retrieved thickness of the interface is found confirming the validity of the model.

引用

页码：806 / 807

页数：2

共 24 条

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