Electrical Signature Verification and Fault Localization in High-density DRAM Device Using Atomic Force Probe

被引：0
|
作者：
Wang, Wei-Chih [1 ]
Liew, San-Lin [1 ]
Chen, Hua-Sheng [1 ]
Chen, Kuang-Liang [1 ]
Luo, Jian-Shing [1 ]
机构：
[1] Inotera Memories Inc, Phys & Elect Failure Anal Dept, Tao Yuan, Taiwan
来源：
ISTFA 2011: CONFERENCE PROCEEDINGS FROM THE 37TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2011年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：269 / 274
页数：6
相关论文
共 50 条
  • [41] Rapid Volume Verification in High-Density Microtiter Plates Using Dual-Dye Photometry
    Knaide, Tanya R.
    Bradshaw, John Thomas
    Rogers, Alex
    McNally, Ceara
    Curtis, Richard H.
    Spaulding, Benjamin W.
    JALA - Journal of the Association for Laboratory Automation, 2006, 11 (05): : 319 - 322
  • [42] High-density optrode-electrode neural probe using SixNy photonics for in vivo optogenetics
    Hoffman, Luis
    Welkenhuysen, Marleen
    Andrei, Alexandru
    Musa, Silke
    Luo, Zhenxiang
    Libbrecht, Sarah
    Severi, Simone
    Soussan, Philippe
    Baekelandt, Veerle
    Haesler, Sebastian
    Gielen, Georges
    Puers, Robert
    Braeken, Dries
    2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2015,
  • [43] Transcription profiling of the early gravitropic response in Arabidopsis using high-density oligonucleotide probe microarrays
    Moseyko, N
    Zhu, T
    Chang, HS
    Wang, X
    Feldman, LJ
    PLANT PHYSIOLOGY, 2002, 130 (02) : 720 - 728
  • [44] Prolog to High-density data storage based on the atomic force microscope -: An introduction to the paper by Mamin, Ried, Terris, and Rugar
    Esch, J
    PROCEEDINGS OF THE IEEE, 1999, 87 (06) : 1012 - 1013
  • [45] High-density localization of active molecules using Structured Sparse Model and Bayesian Information Criterion
    Quan, Tingwei
    Zhu, Hongyu
    Liu, Xiaomao
    Liu, Yongfeng
    Ding, Jiuping
    Zeng, Shaoqun
    Huang, Zhen-Li
    OPTICS EXPRESS, 2011, 19 (18): : 16963 - 16974
  • [46] Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device
    Iwata, F.
    Ohashi, Y.
    Ishisaki, I.
    Picco, L. M.
    Ushiki, T.
    ULTRAMICROSCOPY, 2013, 133 : 88 - 94
  • [47] Study on moisture migration in natural slope using high-density electrical resistivity tomography method
    Yan Ya-jing
    Yan Yong-shuai
    Zhao Gui-zhang
    Zhang Tai-li
    Sun Qiang
    ROCK AND SOIL MECHANICS, 2019, 40 (07) : 2807 - 2814
  • [48] Breast Cancer Detection Using High-Density Flexible Electrode Arrays and Electrical Impedance Tomography
    Campisi, Matthew S.
    Barbre, Curtis
    Chola, Aditya
    Cunningham, Gisselle
    Woods, Virginia
    Viventi, Jonathan
    2014 36TH ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC), 2014, : 1131 - 1134
  • [49] Estimation of sediment trapping behind check dams using high-density electrical resistivity tomography
    Fang, N. F.
    Zeng, Y.
    Ni, L. S.
    Shi, Z. H.
    JOURNAL OF HYDROLOGY, 2019, 568 : 1007 - 1016
  • [50] Novel three-dimensional stacked capacitorless DRAM architecture using partially etched nanosheets for high-density memory applications
    Kim, Min Seok
    Lee, Sang Ho
    Park, Jin
    Bae, Seung Ji
    Hong, Jeong Woo
    Koh, Won Suk
    Yun, Gang San
    Jang, Jaewon
    Bae, Jin-Hyuk
    Kang, In Man
    DISCOVER NANO, 2025, 20 (01)
12345