Electrical Signature Verification and Fault Localization in High-density DRAM Device Using Atomic Force Probe

被引：0
|
作者：
Wang, Wei-Chih [1 ]
Liew, San-Lin [1 ]
Chen, Hua-Sheng [1 ]
Chen, Kuang-Liang [1 ]
Luo, Jian-Shing [1 ]
机构：
[1] Inotera Memories Inc, Phys & Elect Failure Anal Dept, Tao Yuan, Taiwan
来源：
ISTFA 2011: CONFERENCE PROCEEDINGS FROM THE 37TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2011年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：269 / 274
页数：6
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