Investigation of Single-Event Transients in Linear Voltage Regulators

被引：14
|
作者：
Irom, Farokh [1 ]
Miyahira, Tetsuo F. [1 ]
Adel, Philippe C. [1 ]
Laird, Jamie S. [1 ]
Conder, Brandon [1 ]
Pouget, Vincent [2 ]
Essely, Fabien [2 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
[2] Univ Bordeaux, F-33405 Talence, France
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 06期
关键词：
Laser; radiation testing; single-event transient; voltage regulator;
D O I：
10.1109/TNS.2008.2007800
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Single-event transients (SETs) from heavy ions and laser beam are investigated for two positive adjustable linear voltage regulators: the RH117 from Linear Technology and the HS-117RH from Intersil. Both positive and negative going transients are observed. The role of input voltage, load capacitance and supply current on the SET response is discussed.
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页码：3352 / 3359
页数：8
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