4H-SiC Trench Structure Schottky Diodes

被引:7
|
作者
Aketa, Masatoshi [1 ]
Yokotsuji, Yuta [1 ]
Miura, Mineo [1 ]
Nakamura, Takashi [1 ]
机构
[1] ROHM Co Ltd, Ukyo Ku, Kyoto 6158585, Japan
关键词
4H-SiC; Schottky diode; Trench structure;
D O I
10.4028/www.scientific.net/MSF.717-720.933
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents three different structures of Schottky diodes that were fabricated with low Schottky barrier heights. To reduce the forward voltage drop, the introduction of a lower Schttoky barrier is necessary. One of key issues associated with diodes having a low Schottky barrier height and a planar structure is an excessively high leakage current. By introducing the novel trench structure, the leakage current was reduced to a reasonable level. Furthermore it was confirmed that they have minimal switching time during turn-off and high avalanche capability. Thus trench structure Schottky diodes are able to reduce not only switching losses but also conductive losses and demonstrate sufficient robustness.
引用
收藏
页码:933 / 936
页数:4
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