Study of silicon detectors for high resolution radioxenon measurements

被引:10
|
作者
Hennig, Wolfgang [1 ]
Cox, Christopher E. [1 ]
Asztalos, Stephen J. [1 ]
Tan, Hui [1 ]
Franz, Patrick J. [1 ]
Grudberg, Peter M. [1 ]
Warburton, William K. [1 ]
Huber, Alan [2 ]
机构
[1] XIA LLC, Hayward, CA USA
[2] Amptek Inc, Bedford, MA 01730 USA
关键词
Silicon detector; Radioxenon; Beta/X-ray coincidence; Minimum detectable concentration;
D O I
10.1007/s10967-012-2053-y
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Measurement of radioactive xenon in the atmosphere is one of several techniques to detect nuclear weapons testing, typically using either scintillator based coincidence beta/gamma detectors or germanium based gamma only detectors. Silicon detectors have a number of potential advantages over these detectors (high resolution, low background, sensitive to photons and electrons) and are explored in this work as a possible alternative. Using energy resolutions from measurements and detection efficiencies from simulations of characteristic electron and photon energies, the minimum detectable concentration for Xe isotopes was estimated for several possible detector geometries. Test coincidence spectra were acquired with a prototype detector.
引用
收藏
页码:675 / 681
页数:7
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