Reliability of mesa-structure InAlCaAs-InAlAs superlattice avalanche photodiodes

被引:28
|
作者
Watanabe, I
Tsuji, M
Hayashi, M
Makita, K
Taguchi, K
机构
[1] Opto-Electronics Res. Laboratories, NEC Corporation, Tsukuba, Ibaraki 305
关键词
D O I
10.1109/68.502107
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reliability tests of mesa-structure InAlGaAs-InAlAs superlattice avalanche photodiodes (SL-APD's) have been performed by accelerated aging at three different temperatures for the first time. The lifetime of the SL-APD's is estimated to be over 1.0 x 10(5) hours at 50 degrees C with a degradation activation energy of 1 eV. These results indicate that the SL-APD's have a reliable lifetime for 2.5-10 Gb/s LAN applications.
引用
收藏
页码:824 / 826
页数:3
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