共 50 条
- [41] Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (04): : 1733 - 1736
- [44] Study of Melting Processes in Semicrystalline Polymers Using a Combination of Ultrafast Chip Calorimetry and Nanofocus Synchrotron X-Ray Diffraction [J]. NANOTECHNOLOGIES IN RUSSIA, 2016, 11 (5-6): : 305 - 311
- [47] SURFACE MELTING OF PB(110) STUDIED BY X-RAY PHOTOELECTRON DIFFRACTION [J]. PHYSICAL REVIEW B, 1990, 41 (15): : 10848 - 10851
- [49] Morphological and elemental mapping of gallstones using synchrotron microtomography and synchrotron X-ray fluorescence spectroscopy [J]. JGH OPEN, 2019, 3 (05): : 381 - 387
- [50] An electron beam melting system for in-situ synchrotron X-ray monitoring [J]. ADDITIVE MANUFACTURING LETTERS, 2022, 3