Photothermal deflection spectroscopy (PDS) is used to investigate the optical properties of CuInS2 thin film semiconductors, which are different in composition and technical preparation conditions. It is found in the experiment that absorption coefficient and direct band gap of the samples can be changed under the control of substrate temperature and proportion of [Cu]/[In], which agrees with the reported results by other methods.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Meadows, H. J.
Regesch, D.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Regesch, D.
Thevenin, M.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Thevenin, M.
Sendler, J.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Sendler, J.
Schuler, T.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Schuler, T.
Misra, S.
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Univ Utah, Elect & Comp Engn, Salt Lake City, UT USAUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Misra, S.
Simonds, B. J.
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Univ Utah, Mat Sci & Engn, Salt Lake City, UT USAUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Simonds, B. J.
Scarpulla, M. A.
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Univ Utah, Elect & Comp Engn, Salt Lake City, UT USA
Univ Utah, Mat Sci & Engn, Salt Lake City, UT USAUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Scarpulla, M. A.
Gerliz, V.
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Carl von Ossietzky Univ Oldenburg, Lab Chalcogenide Photovolta, D-26111 Oldenburg, GermanyUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Gerliz, V.
Guetay, L.
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Carl von Ossietzky Univ Oldenburg, Lab Chalcogenide Photovolta, D-26111 Oldenburg, GermanyUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Guetay, L.
Guillot, J.
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Ctr Rech Publ Gabriel Lippmann, Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
Guillot, J.
Dale, P. J.
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Univ Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, LuxembourgUniv Luxembourg, Phys & Mat Sci Res Unit, L-4422 Belvaux, Luxembourg
机构:
Univ Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond, Merida 5101, VenezuelaUniv Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond, Merida 5101, Venezuela
Rincón, C
Márquez, R
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Univ Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond, Merida 5101, VenezuelaUniv Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond, Merida 5101, Venezuela
机构:North Carolina State Univ at, Raleigh, Dep of Chemistry, Raleigh,, NC, USA, North Carolina State Univ at Raleigh, Dep of Chemistry, Raleigh, NC, USA
LANGE, P
NEFF, H
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机构:North Carolina State Univ at, Raleigh, Dep of Chemistry, Raleigh,, NC, USA, North Carolina State Univ at Raleigh, Dep of Chemistry, Raleigh, NC, USA
NEFF, H
FEARHEILEY, M
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机构:North Carolina State Univ at, Raleigh, Dep of Chemistry, Raleigh,, NC, USA, North Carolina State Univ at Raleigh, Dep of Chemistry, Raleigh, NC, USA
FEARHEILEY, M
BACHMANN, KJ
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机构:North Carolina State Univ at, Raleigh, Dep of Chemistry, Raleigh,, NC, USA, North Carolina State Univ at Raleigh, Dep of Chemistry, Raleigh, NC, USA