Optical properties of CuInSe2 film semiconductor studied with potothermal deflection spectroscopy

被引:0
|
作者
Dong, MY [1 ]
Chen, XF [1 ]
Deng, H [1 ]
机构
[1] Zhejiang Univ, Dept Phys, Hangzhou 310027, Peoples R China
来源
SOLAR OPTICAL MATERIALS XVI | 1999年 / 3789卷
关键词
photothermal deflection spectroscopy (PDS); CuInSe2;
D O I
10.1117/12.367560
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Photothermal deflection spectroscopy (PDS) is used to investigate the optical properties of CuInS2 thin film semiconductors, which are different in composition and technical preparation conditions. It is found in the experiment that absorption coefficient and direct band gap of the samples can be changed under the control of substrate temperature and proportion of [Cu]/[In], which agrees with the reported results by other methods.
引用
收藏
页码:131 / 137
页数:7
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