E-polarized Plane Wave Diffraction by a Thin Material Strip

被引：0

作者：

Nagasaka, T. ^{[1
]}

Kobayashi, K. ^{[1
]}

机构：

[1] Chuo Univ, Dept Elect Elect & Commun Engn, Bunkyo Ku, Tokyo 1128551, Japan

来源：

2017 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA) | 2017年

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

E-polarized plane wave diffraction by a thin material strip is analyzed using the Wiener-Hopf technique together with approximate boundary conditions. Exact and high-frequency asymptotic solutions are obtained. The scattered field is evaluated asymptotically based on the saddle point method and a far field expression is derived. Scattering characteristics are discussed via numerical results of the radar cross section (RCS).

引用

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页码：796 / 799

页数：4

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