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E-polarized Plane Wave Diffraction by a Thin Material Strip

被引：0
|
作者：
Nagasaka, T. [1 ]
Kobayashi, K. [1 ]
机构：
[1] Chuo Univ, Dept Elect Elect & Commun Engn, Bunkyo Ku, Tokyo 1128551, Japan
来源：
2017 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA) | 2017年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
E-polarized plane wave diffraction by a thin material strip is analyzed using the Wiener-Hopf technique together with approximate boundary conditions. Exact and high-frequency asymptotic solutions are obtained. The scattered field is evaluated asymptotically based on the saddle point method and a far field expression is derived. Scattering characteristics are discussed via numerical results of the radar cross section (RCS).
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页码：796 / 799
页数：4
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