A double-path measurement head for strain measurements with modulation interferometry

被引：0
|
作者：
Kloos, G [1 ]
机构：
[1] EINDHOVEN UNIV TECHNOL,NL-5600 MB EINDHOVEN,NETHERLANDS
来源：
OPTICS AND LASERS IN ENGINEERING | 1997年 / 28卷 / 04期
关键词：
D O I：
10.1016/S0143-8166(97)00011-0
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The design of a new measurement head for interferometric dilatometry is presented. It is shown how a double-path detection scheme can be implemented in a homodyne interferometer. Possible applications of the proposed instrument include the investigation of quadratic electrostriction and the inverse piezoelectric effect. (C) 1997 Elsevier Science Ltd.
引用
收藏
页码：287 / 291
页数：5
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