Double shear speckle interferometry for curvature measurement

被引：6
|
作者：
Ganesan, AR [1 ]
Murukeshan, VM [1 ]
Meinlschmidt, P [1 ]
Sirohi, RS [1 ]
机构：
[1] Indian Inst Technol, APPL OPT LAB, DEPT PHYS, Madras 600036, Tamil Nadu, INDIA
来源：
LASER INTERFEROMETRY VIII: TECHNIQUES AND ANALYSIS | 1996年 / 2860卷
关键词：
shear interferometry; speckle; curvature; second order derivative;
D O I：
10.1117/12.276305
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：184 / 191
页数：8
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