IRD Digital Background Calibration of SAR ADC With Coarse Reference ADC Acceleration

被引:30
|
作者
Wang, Guanhua [1 ]
Kacani, Foti [1 ]
Chiu, Yun [1 ]
机构
[1] Univ Texas Dallas, Texas Analog Ctr Excellence, Analog & Mixed Signal Lab, Dallas, TX 75080 USA
关键词
Analog-to-digital converter (ADC); background calibration; correlation; internal redundancy dithering (IRD); reference analog-to-digital converter (ADC); successive approximation;
D O I
10.1109/TCSII.2013.2291051
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A coarse analog-to-digital converter (ADC) is used as the reference path to resolve the input interference problem in correlation-based background calibration of multistep ADCs. A 16-bit successive-approximation-register (SAR) ADC employing a subbinary architecture is calibrated with an 8-bit reference path, achieving a nearly 20x reduction in convergence time and greatly improved steady-state linearity performance in simulation. The SAR ADC bit-weight calibration is based on the principle of internal redundancy dithering (IRD), a technique in which the bit decision thresholds are dithered by a pseudorandom bit sequence (PRBS) within the redundancy region. Aided by the coarse reference ADC, behavioral simulation shows that 89-dB signal-to-noise plus distortion ratio and the 115-dB spurious-free dynamic range (SFDR) are achievable with the proposed calibration for a SAR ADC with 1% digital-to-analog converter mismatch errors.
引用
收藏
页码:11 / 15
页数:5
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