Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs

被引：17
|
作者：
Heijmen, T [1 ]
Kruseman, B [1 ]
van Veen, R [1 ]
Meijer, M [1 ]
机构：
[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands
来源：
2004 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/RELPHY.2004.1315446
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：675 / 676
页数：2
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