Automatic test generation for micro-architectural verification of configurable microprocessor cores with user extensions

被引：0
|
作者：
Bhattacharyya, N
Wang, A
机构：
来源：
SIXTH IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS | 2001年
关键词：
D O I：
10.1109/HLDVT.2001.972801
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：14 / 15
页数：2
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