Determination of the interdiffusion coefficient at low temperature in Ni/NiCr nanometer-scale multilayers using X-ray reflectivity

被引：2

作者：

Debelle, A. ^{[1
,2
]}

Michel, A. ^{[3
]}

Loyer-Prost, M. ^{[1
]}

Rieger, T. ^{[1
]}

Billard, A. ^{[4
]}

Nastar, M. ^{[1
]}

机构：

[1] Univ Paris Saclay, Serv Rech Met Phys, CEA, F-91191 Gif Sur Yvette, France

[2] Univ Paris Saclay, IJCLab, CNRS IN2P3, F-91405 Orsay, France

[3] Univ Poitiers, Inst Pprime, UPR 3346, CNRS ENSMA, F-86960 Futuroscope, France

[4] Univ Bourgogne Franche Comte, Dept MN2S, UMR CNRS 6174, UTBM,FEMTO ST, Rue Thierry Mieg, F-90000 Belfort, France

来源：

MATERIALIA | 2022年 / 25卷

基金：

欧盟地平线“2020”;

关键词：

NI-CR; DIFFUSION; ALLOYS; PHASE;

D O I：

10.1016/j.mtla.2022.101528

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The interdiffusion coefficient in the Ni/Cr system was determined at low temperature using Ni/Ni0.78Cr0.22 nanometer-scale multilayers with periods of 3.65 and 4.50 nm. X-ray reflectivity measurements were carried out to monitor the 1st Bragg peak intensity with annealing time, at both 400 and 450 ? temperatures. The obtained kinetics of the composition modulation decay allowed determining the interdiffusion coefficients of the uniform final solid solution, Ni0.89Cr0.11. Values in the order of 10 - 21 to 10-20 cm(2).s(-1) at 400 ? and 450 ?, respectively, were found, in line with extrapolations from data of Cr diffusion obtained at higher temperature.

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页数：8

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