Thermoelectric power of polycrystalline Si films prepared by microwave plasma chemical vapour deposition

被引:4
|
作者
Yonekubo, S [1 ]
Kamimura, K [1 ]
Onuma, Y [1 ]
机构
[1] SHINSHU UNIV, FAC ENGN, DEPT ELECT & ELECT ENGN, NAGANO 380, JAPAN
关键词
silicon; chemical vapour deposition; electrical properties and measurements; sensors;
D O I
10.1016/0040-6090(96)08600-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The thermoelectric properties of silicon (Si) thin films prepared by microwave plasma chemical vapour deposition were studied. For preparation, monosilane (SiH4) was used as the source gas, and phosphine (PH3) and diborane (B2H6) were used as the doping gases. X-ray diffraction shows that Si films were polycrystalline and that the average grain size of these films was approximately 100 nm. Measurement of the thermoelectromotive force between Si films and the counter electrodes revealed that the thermoelectric power depends on the flow rate of the doping gas, and that the Si films prepared at the B2H6/SiH4 flow rate of 0.05% showed a maximum thermoelectric power of approximately 0.9 mV K-1.
引用
收藏
页码:159 / 161
页数:3
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