Thermoelectric power of polycrystalline Si films prepared by microwave plasma chemical vapour deposition

被引:4
|
作者
Yonekubo, S [1 ]
Kamimura, K [1 ]
Onuma, Y [1 ]
机构
[1] SHINSHU UNIV, FAC ENGN, DEPT ELECT & ELECT ENGN, NAGANO 380, JAPAN
关键词
silicon; chemical vapour deposition; electrical properties and measurements; sensors;
D O I
10.1016/0040-6090(96)08600-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The thermoelectric properties of silicon (Si) thin films prepared by microwave plasma chemical vapour deposition were studied. For preparation, monosilane (SiH4) was used as the source gas, and phosphine (PH3) and diborane (B2H6) were used as the doping gases. X-ray diffraction shows that Si films were polycrystalline and that the average grain size of these films was approximately 100 nm. Measurement of the thermoelectromotive force between Si films and the counter electrodes revealed that the thermoelectric power depends on the flow rate of the doping gas, and that the Si films prepared at the B2H6/SiH4 flow rate of 0.05% showed a maximum thermoelectric power of approximately 0.9 mV K-1.
引用
收藏
页码:159 / 161
页数:3
相关论文
共 50 条
  • [21] Comparative investigation of Si-C-N Films prepared by plasma enhanced chemical vapour deposition and magnetron sputtering
    Kozak, A. O.
    Porada, O. K.
    Ivashchenko, V. I.
    Ivashchenko, L. A.
    Scrynskyy, P. L.
    Tomila, T. V.
    Manzhara, V. S.
    APPLIED SURFACE SCIENCE, 2017, 425 : 646 - 653
  • [22] Hydrophility of TiO2 films prepared by plasma enhanced chemical vapour deposition
    Horakova, M.
    Kolouch, A.
    Spatenka, P.
    Spatenka, P.
    CZECHOSLOVAK JOURNAL OF PHYSICS, 2006, 56 : B1185 - B1191
  • [23] Properties of amorphous SiC thin films prepared by plasma enhanced chemical vapour deposition
    Huran, J
    Kobzev, AP
    Safrankova, J
    Hotovy, I
    SEMICONDUCTING AND INSULATING MATERIALS, 1996: PROCEEDINGS OF THE 9TH CONFERENCE ON SEMICONDUCTING AND INSULATING MATERIALS (SIMC'96), 1996, : 249 - 252
  • [24] Synthesis and characterization of nanocrystalline diamond films deposited by microwave plasma chemical vapour deposition
    Zhou, Wen-Long
    Zhang, Ming
    Song, Xue-Mei
    Yan, Hui
    CHEMICAL, MECHANICAL AND MATERIALS ENGINEERING, 2011, 79 : 187 - 191
  • [25] Effects of rf power on the structural properties of carbon nitride thin films prepared by plasma enhanced chemical vapour deposition
    Othman, Maisara
    Ritikos, Richard
    Khanis, Noor Hamizah
    Rashid, Nur Maisarah Abdul
    Rahman, Saadah Abdul
    Ab Gani, Siti Meriam
    Muhamad, Muhamad Rasat
    THIN SOLID FILMS, 2011, 519 (15) : 4981 - 4986
  • [26] Growth and characterization of polycrystalline Si films prepared by hot-wire chemical vapor deposition
    Wuu, DS
    Lien, SY
    Mao, HY
    Wu, BR
    Hsieh, IC
    Yao, PC
    Wang, JH
    Chen, WC
    THIN SOLID FILMS, 2006, 498 (1-2) : 9 - 13
  • [27] Grain growth of copper films prepared by chemical vapour deposition
    Rha, SK
    Lee, WJ
    Lee, SY
    Kim, DW
    Park, CO
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1997, 8 (04) : 217 - 221
  • [28] Grain growth of copper films prepared by chemical vapour deposition
    SA-KYUN RHA
    WON-JUN LEE
    SEUNG-YUN LEE
    DONG-WON KIM
    CHONG-OOK PARK
    Journal of Materials Science: Materials in Electronics, 1997, 8 : 217 - 221
  • [29] Plasma enhanced chemical vapour deposition of diamond films
    Gicquel, A.
    Anger, E.
    Fabre, D.
    Vide, les Couches Minces, 1992, (261):
  • [30] Properties of hydrogenated amorphous/nanocrystalline carbon films prepared by plasma enhanced chemical vapour deposition
    Huran, J.
    Zat'ko, B.
    Bohacek, P.
    Kobzev, A. P.
    Vincze, A.
    Malinovsky, L'
    Valovic, A.
    INNOVATIONS IN THIN FILM PROCESSING AND CHARACTERISATION (ITFPC 2009), 2010, 12