Improved Reliability of Rarely Switching CMOS Circuits in ULSI Devices

被引：0
|
作者：
Sofer, Sergey [1 ]
Livshits, Pavel [2 ]
Priel, Michael [1 ]
机构：
[1] Freescale Semicond Israel Ltd, IL-46120 Herzliyya, Israel
[2] Bar Ilan Univ, Sch Engn, IL-52900 Ramat Gan, Israel
来源：
2012 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT | 2012年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this work, novel configurations of rarely switching ULSI I/O circuits, which provide a "refresh" operation allowing for temporal bias removal without any changes in the logic state or electrical characteristics of these circuits, are presented. This bias removal significantly reduces the aging of the circuits and allows for the lessening of design timing margins, thus reducing the overall design costs.
引用
收藏
页码：179 / 182
页数：4
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