Analysis of silver columnar thin films by atomic force microscopy

被引：1

作者：

Benkabou, Fatima ^{[1
]}

Lakhtakia, Akhlesh ^{[2
]}

机构：

[1] Univ Moncton, Dept Phys & Astron, Moncton, NB E1A 3E9, Canada

[2] Penn State Univ, NanoMM Nanoengn Metamat Grp, Dept Engn Sci & Mech, University Pk, PA 16802 USA

来源：

NANOSTRUCTURED THIN FILMS | 2008年 / 7041卷

关键词：

Atomic force microscope; columnar thin film; sculptured thin film; silver; surface morphology;

D O I：

10.1117/12.796212

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

引用

页数：7

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