Impact of neutron induced Single-Event Multiple Transients in ADDLL based frequency multiplier

被引：0
|
作者：
Srinivasan, Balaji [1 ]
Rajalingam, Prithiviraj [2 ]
Routray, Soumyaranjan [2 ]
机构：
[1] Loyola ICAM Coll Engn & Technol, Dept Elect & Commun Engn, Chennai 600034, India
[2] SRM Inst Sci & Technol, Dept Elect & Commun Engn, Chennai 603203, India
来源：
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS | 2022年 / 154卷
关键词：
Delay-Locked Loop; Frequency multiplier; Radiation effect; DELAY-LOCKED LOOP; DESIGN;
D O I：
10.1016/j.aeue.2022.154315
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the impact of radiation-induced Single-Event Multiple Transients (SEMT) in All Digital Delay-Locked Loop (ADDLL) and its impact on the output of frequency multiplier. The performance of the frequency multiplier such as the phase noise and jitter etc. are degraded due propagation of the SEMT from the ADDLL. This paper: (1) shows the impact of SEMTs in the ADDLL in modern technologies, (2) shows how the frequency multiplier circuit performance can vary depending on the severity of SEMTs effects, and (3) demonstrates proposed edge-combined ADDLL based frequency multiplier performance benefits for more reliable operation.
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页数：10
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